Automated Optical Inspection system for counterfeit IC detection
A comprehensive AI-powered system for automated optical inspection of IC markings to detect counterfeit electronic components. Features real-time image analysis, batch processing, OEM datasheet extraction, and detailed verification reports with drift detection capabilities.
The engine behind the experience
An advanced full-stack Automated Optical Inspection (AOI) system developed for Bharat Electronics Limited (BEL) to combat counterfeit Integrated Circuit (IC) components. The platform enables quality assurance officers to verify IC authenticity through AI-powered image analysis, OCR text extraction, and logo detection. The system consists of multiple interconnected modules: a Next.js web application with responsive UI for single and batch IC analysis, an AI-powered microservice for image processing, a multi-modal chat interface using Google Gemini for OEM datasheet extraction, and a comprehensive reporting dashboard with analytics. Key features include real-time camera capture for IC inspection, OCR processing for text extraction from IC markings, brand logo detection and verification, database matching against authentic OEM specifications, batch processing for multiple IC images with ZIP file support, drift detection algorithms to monitor quality trends over time, PDF report generation with detailed verification results, and an AI-powered datasheet extraction tool that uses multimodal AI to extract marking patterns from OEM datasheets. Built with a focus on industrial-grade reliability and user experience, the application uses MySQL for data persistence, implements JWT-based authentication, and provides comprehensive analytics including OEM-wise counterfeit detection statistics, confidence scoring, and audit trails for quality control purposes.